Thin film metrology systems are used to measure the film thickness accurately. A series of film layers that act as a conductors, semiconductors, or bare wafers are deposited on an IC during IC fabrication. Thin film metrology systems are required during thin film deposition process to monitor and measure thin film parameters such as thickness, resistivity, and stress. There are various technologies used to measure the film thickness which include profilometry, ellipsometry, spectroscopic reflectrometry, and X-ray analysis.
Analysts forecast the Global Thin-film Metrology Systems market will grow at a CAGR of 3.4 percent over the period 2014-2019.
This report covers the present scenario and growth prospects of the Global Thin Film Metrology Systems market for the period 2015-2019. It considers 2014 as the base year and provides data for the trailing 12 months. To calculate the market size, the report considers revenue generated from the sales of thin film metrology systems to various end-users including:
- Nova Measuring Instruments
- Rudolph Technologies
Other Prominent Vendors
- Hitachi High-Technologies
- SCREEN Holdings
Key Market Driver
- Increased Level of Complexity in ICs
Key Market Challenge
- Cyclic Nature of Semiconductor Industry
Key Market Trend
- Increasing Demand for Integration and Miniaturization of Semiconductor Devices
Key Questions Answered in this Report
- What will the market size be in 2019 and what will the growth rate be?
- What are the key market trends?
- What is driving this market?
- What are the challenges to market growth?
- Who are the key vendors in this market space?
- What are the market opportunities and threats faced by the key vendors?
- What are the strengths and weaknesses of the key vendors?
Have any Query on the Report get your Queries Resolved at http://www.sandlerresearch.org/inquire-before-buying?rname=30019 .
(Prices start at US $2500 for a single user PDF)
LiDAR stands for Light Detection and Ranging. It is a technology to generate precise and spatial information about a particular object. The technology works on the principle of reflection where focused beam of light is emitted and then detected by the sensor after reflecting from the object and the time taken for the process is measured. This data is used to calculate the distances to objects and create a 3D map of any space.
The growing volume of e-waste is a major concern globally. Rapid advances in technology and increasing buying power of consumers have resulted in high obsolescence rate of electronic products. Consumers tend to replace older electronic products with latest versions available in the market, leading to dramatic rise in e-waste worldwide. Unscientific disposal of e-waste has triggered serious environmental hazards.