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Global Thin Film Metrology Systems Market Research Report 2015-2019

Thin film metrology systems are used to measure the film thickness accurately. A series of film layers that act as a conductors, semiconductors, or bare wafers are deposited on an IC during IC fabrication. Thin film metrology systems are required during thin film deposition process to monitor and measure thin film parameters such as thickness, resistivity, and stress. There are various technologies used to measure the film thickness which include profilometry, ellipsometry, spectroscopic reflectrometry, and X-ray analysis.

Analysts forecast the Global Thin-film Metrology Systems market will grow at a CAGR of 3.4 percent over the period 2014-2019.

This report covers the present scenario and growth prospects of the Global Thin Film Metrology Systems market for the period 2015-2019. It considers 2014 as the base year and provides data for the trailing 12 months. To calculate the market size, the report considers revenue generated from the sales of thin film metrology systems to various end-users including:

  • ODMs
  • OEMs
  • Foundries

Key Regions

  • Americas
  • APAC
  • EMEA

Key Vendors

  • KLA-Tencor
  • Nanometrics
  • Nova Measuring Instruments
  • Rudolph Technologies

Other Prominent Vendors

  • Hitachi High-Technologies
  • SCREEN Holdings
  • Semilab

Key Market Driver

  • Increased Level of Complexity in ICs

Key Market Challenge

  • Cyclic Nature of Semiconductor Industry

Key Market Trend

  • Increasing Demand for Integration and Miniaturization of Semiconductor Devices

Key Questions Answered in this Report

  • What will the market size be in 2019 and what will the growth rate be?
  • What are the key market trends?
  • What is driving this market?
  • What are the challenges to market growth?
  • Who are the key vendors in this market space?
  • What are the market opportunities and threats faced by the key vendors?
  • What are the strengths and weaknesses of the key vendors?

Have any Query on the Report get your Queries Resolved at http://www.sandlerresearch.org/inquire-before-buying?rname=30019 .

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